DEVICE FOR SETTING TDEV MASK CHARACTERISTIC FOR WANDER GENERATOR

Japanese Patent JP3683779

B2

PROBLEM TO BE SOLVED: To provide a device for setting a TDEV(time deviation) mask that can easily revise setting of a TDEV mask characteristic.
SOLUTION: The TDEV mask characteristic setting device 12 for a wander generator to set a TDEV mask characteristic is provided with a TDEV mask characteristic file 29 that stores TDEV mask characteristics each consisting of interconnected line- segments, a TDEV mask characteristic read means 32 that reads a TDEV mask characteristic designated through operation from the TDEV mask characteristic file and displays the read TDEV mask characteristic, a revised instruction capture means 33 that captures a revised instruction of a start point of each line segment configuring a TDEV mask characteristic entered through operations or a revised instruction of a characteristic value at the start point, and a TDEV mask characteristic revision means 34 that receives each revised instruction captured by the revised instruction capture means and revises the designated TDEV mask characteristic through operations by calculating each parameter to specify the start point, the slope and a corresponding line segment including the characteristic value at the start point for each line segment configuring the TDEV mask characteristic designated through operations.

JPS5448288	DIGITAL PHASE COMPARATOR
WO/1994/011744	PRECISION DITIGAL MULTIMETER AND WAVEFORM SYNTHESIZER FOR MULTI-SIGNALS WITH DISTORTED WAVEFORMS EMBEDDED IN NOISE

Kazuhiko Ishibe
Tetsuya Tada

JP2000184962A

August 17, 2005

June 20, 2000

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Anritsu Co., Ltd.

G01R25/00; G01R29/02; H03K5/156; H04J3/14; H04L1/20; (IPC1-7): H03K5/156; G01R25/00; G01R29/02

JP5037311A
JP8248078A
JP10150430A
JP837484A
JP5284220A

Takehiko Suzue
Sadao Muramatsu
Atsushi Tsuboi
Ryo Hashimoto
Satoshi Kono
Makoto Nakamura

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