To provide a dielectric ceramic composition whose occurrence rate of short circuit defects is reduced so that the improvement of its yield can be attained without deteriorating its temperature coefficient and its insulation resistance at the time of high temperature loading.
The dielectric ceramic composition is expressed by the general formula: xRe2O3-yBaO-zTiO2 (wherein Re is at least one kind of rare-earth elements selected from Nd, La, Pr, Ce, and Sm, and x+y+z=100), and the above x, y, and z are each set within the range of a prescribed molar composition. Nb2O5 of <0.3 wt.% (excluding 0 wt.%), SiO2 of ≤3 wt.% (excluding 0 wt.%), and MnO of ≤3 wt.% (excluding 0 wt.%) are added to 100 wt.% of the composition of the general formula respectively.
OKADA KAZUNARI
KOJIMA SHOZO
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