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Patent Searching and Data


Title:
DISPLACEMENT REDUCTION PROBE FOR TEMPORARY AXIAL ALIGNMENT
Document Type and Number:
Japanese Patent JP2004286722
Kind Code:
A
Abstract:

To provide a new means by which an axial alignment is performed easily with extending appreciable range in the measurement by a roundness measuring device.

The probe structure of the roundness measurement consists of the structure connecting with a joint 003 using an elastic component. The prove can be made flexible at the joint 003. When the contacting part 005 of the probe receives displacement with this structure, the joint 003 is also flexed, a small angular displacement in a sensor is measured because of flexed change of the joint 003. If a load to the sensor is decreased, the range of the measurement is developed. The structure which reduces the displacement in a displacement detection part 006 is featured by utilizing a dynamical relation established between the contacting part 005 and the displacement of the displacement detection part 006.


Inventors:
SATO NATSUO
NAGATSU YOSHIYUKI
ISHIKAWA SAEKI
Application Number:
JP2003122897A
Publication Date:
October 14, 2004
Filing Date:
March 24, 2003
Export Citation:
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Assignee:
SHIZUOKA PREFECTURE
CHUO SEIKO KK
International Classes:
G01B5/28; G01B5/20; G01B21/30; (IPC1-7): G01B5/28; G01B21/30