Title:
DISTORTION MEASURING DEVICE, DISTORTION AMOUNT, AND DISTORTION DIRECTION MEASURING METHOD
Document Type and Number:
Japanese Patent JP2015200501
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a distortion measuring device capable of measuring a direction and magnitude of distortion which accompanies deformation of a complicated and a wide range of shapes.SOLUTION: A distortion measuring device includes a plurality of capacitance type sensors having a dielectric layer composed of an elastomer composition and an electrode layer laminated on a front side and a rear side of the dielectric layer. The plurality of capacitance type sensors comprises a band-like flat shape. At least one end part of one capacitance type sensor is connected with at least one end part of another capacitance type sensor in a direction not matching with a mutual longitudinal direction, and a distortion amount and a distortion direction are measured from an amount of contraction in the longitudinal direction of the plurality of capacitance type sensors. The plurality of capacitance type sensors may be connected so as to constitute each side of a triangle in a planar view. The plurality of capacitance type sensors may be regularly arranged. The plurality of capacitance type sensors may be arranged at random. The electrode layer may include a carbon nanotube.
Inventors:
TADA MITSUNORI
OTAKA HIDEO
NAKAMOTO HIROYUKI
OTAKA HIDEO
NAKAMOTO HIROYUKI
Application Number:
JP2014077391A
Publication Date:
November 12, 2015
Filing Date:
April 03, 2014
Export Citation:
Assignee:
NAT INST OF ADVANCED IND SCIEN
BANDO CHEMICAL IND
UNIV KOBE
BANDO CHEMICAL IND
UNIV KOBE
International Classes:
G01B7/16
Attorney, Agent or Firm:
Patent Business Corporation Suncrest International Patent Office
Takashi Shiotani
Takashi Shiotani