Title:
ELECTRICAL INSPECTION APPARATUS AND ELECTRICAL INSPECTION METHOD FOR FILM CARRIER TAPE FOR MOUNTING ELECTRONIC COMPONENTS
Document Type and Number:
Japanese Patent JP3947513
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To perform electrical inspections, such as a continuity test continuously and with high inspection accuracy, even for wirings which are about to break by deficit or the like.
SOLUTION: The inspection apparatus comprises a forced bending section 14, having a forced bending device 18 which forcefully bends a wiring pattern of a film carrier tape for mounting electronic components 12 and an electrical inspection section 16, which is placed downstream of the forced bending section 14 and brings a pair of probe pins into contact with the wiring pattern of the film carrier tape 12, to inspect the conductive condition of the wiring pattern.
Inventors:
Masahiko Yamamoto
Yoshihiro Yukiyama
Fujino
Katsunori Deke
Yoshihiro Yukiyama
Fujino
Katsunori Deke
Application Number:
JP2003364855A
Publication Date:
July 25, 2007
Filing Date:
October 24, 2003
Export Citation:
Assignee:
Mitsui Mining & Smelting Co., Ltd.
International Classes:
G01R31/28; G01R31/00; G01R31/02; H01L21/60; H01L21/66; H05K3/00; (IPC1-7): G01R31/28; H01L21/60; H05K3/00
Domestic Patent References:
| JP2004144634A |
Attorney, Agent or Firm:
Shunichiro Suzuki
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