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Patent Searching and Data


Title:
ELECTRON MICROSCOPE WITH ENERGY FILTER
Document Type and Number:
Japanese Patent JP2000268766
Kind Code:
A
Abstract:

To analyze with high accuracy in a minute region by increasing an acceleration voltage for controlling deviation against radiation optical system as much as possible.

An arithmetic and logic unit 18 for relative correction controls a power supply 15 for a radiation lens control based on a control signal from a superimposed voltage control means 14 for controlling the current from the radiation lens control power supply 15 to the radiation lens 3. When a loss image of energy loss ΔE is observed in a condition set to observe an image with an acceleration voltage V which imparts the energy of E to an electron e by using an energy filter provided with focus adjustment for an electron e with energy E, the acceleration voltage is set to V+ΔV for increasing energy of the electron up to E+ΔE, and the irradiation lens is supplied with a current based on the acceleration voltage V+ΔV.


Inventors:
KANAYAMA TOSHIKATSU
Application Number:
JP7345699A
Publication Date:
September 29, 2000
Filing Date:
March 18, 1999
Export Citation:
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Assignee:
JEOL LTD
International Classes:
H01J37/244; H01J37/26; (IPC1-7): H01J37/26; H01J37/244
Attorney, Agent or Firm:
Kenji Aoki (7 outside)