EQUIPMENT DIAGNOSTIC APPARATUS, EQUIPMENT DIAGNOSTIC METHOD, AND EQUIPMENT DIAGNOSTIC PROGRAM

Japanese Patent JP2015132439

A

PROBLEM TO BE SOLVED: To provide an equipment diagnostic apparatus capable of ensuring clear determination basis and minimizing overall risk.SOLUTION: An equipment diagnostic apparatus of the present invention comprises: an input data management unit that creates a first probability distribution for determining whether equipment is abnormal using normal sample data on normal equipment, and that creates a second probability distribution for determining whether the equipment is normal using abnormal sample data on abnormal equipment; a threshold determination unit that determines a threshold common to the first probability distribution and the second probability distribution so as to obtain a smallest sum of a first probability that is a probability that an actual machine as diagnostic target equipment is determined to be abnormal on the basis of the first probability distribution and a second probability that is a probability that the actual machine as the diagnostic target equipment is determined to be normal on the basis of the second probability distribution; and a diagnostic unit that determines whether the actual machine is normal on the basis of a magnitude relation between the common threshold and diagnostic target data acquired from the actual machine.

JP2010127482	AIR CONDITIONER
JP3270542	AIR CONDITIONER

YOSHIDA YASUTAKA
SEKIGUCHI KYOICHI
DAIBO MOTOO
FUJII TATSURO

JP2014004909A

July 23, 2015

January 15, 2014

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HITACHI BUILDING SYS CO LTD

F24F11/02; F25B49/04; G05B23/02

JP2012047364A	2012-03-08
JP2007017032A	2007-01-25
JPH1019427A	1998-01-23
JP2013516674A	2013-05-13

US20120216552A1	2012-08-30
US20130339080A1	2013-12-19
US20090144023A1	2009-06-04

Isono Dozo
Etsuo Tada

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