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Title:
EQUIPMENT FOR MACHINING SEMICONDUCTOR WAFER
Document Type and Number:
Japanese Patent JPH04309224
Kind Code:
A
Abstract:

PURPOSE: To obtain an equipment of machining a semiconductor wafer which can form wafers from a semiconductor ingot without a lapping process by which a thick transformed layer by machining is formed.

CONSTITUTION: The upper end surface of a semiconductor ingot 7 almost vertically retained by a first chuck 6 is ground by a first and a second diamond grinding machine 8, 9, and a wafer 7a having a specified thickness is cut from the upper end portion of the ingot 7 by using a slicer 13. The upper surface of the wafer to be cut by the slicer 13 is retained by a second chuck 21, the upper surface is used as a reference plane, the lower surface of the wafer 7a is cut by a third and a fourth diamond grinding machine 22, 23, and polishing processes are performed in order by a first polishing equipment 25, a second polishing equipment 26, and a float polishing equipment 27.


Inventors:
KUNIYOSHI MASAAKI
Application Number:
JP7523991A
Publication Date:
October 30, 1992
Filing Date:
April 08, 1991
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
B24B7/22; B24B51/00; B28D1/00; B28D5/02; H01L21/304; (IPC1-7): B24B7/22; B24B51/00; H01L21/304
Attorney, Agent or Firm:
Takehiko Suzue