EQUIPMENT-MANAGEMENT SYSTEM IN ANALYSIS SYSTEM

Japanese Patent JP3212922

B2

PROBLEM TO BE SOLVED: To reduce entry omission or the like by measuring a standard sample and by displaying a table or a chart for displaying a calculated analysis value and a measurement accuracy value being calculated according to the analysis value in time series.
SOLUTION: In the measurement of accuracy, each of standard samples A and B with different concentration is specifically analyzed for several times, and the analysis value and the standard deviation of each of the standard samples A and B are obtained. A range 32 for controlling the analysis value and the standard deviation of each of the standard samples A and B, at the same time, a section 33 for indicating a measurement data, the analysis value, and the standard deviation and a section 34 for entering the name of a measuring personnel are displayed in a table 30 for recording accuracy control. The section 34 is inputted by the measuring personnel from a keyboard, a section 33 is automatically displayed for each analysis, and a graph is automatically platted in a control chart 31 for each analysis. Therefore, when the specific analysis of the standard samples A and B is performed, the analysis value and the standard deviation being calculated, for example, by a personal computer are automatically written into the table 30 for recording accuracy control and the control chart 31.

Ken Uemura
Hiroshi Kurisu
Riyu Ishikura
Toshihide Sakai

JP27394197A

September 25, 2001

September 18, 1997

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HORIBA, Ltd.

G01D21/00; G01N35/00; (IPC1-7): G01D21/00; G01N35/00

JP8211064A
JP8152824A
JP61128750U
JP690208B2

Yoshinobu Yamamura

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