Title:
故障診断装置
Document Type and Number:
Japanese Patent JP7325640
Kind Code:
B2
Abstract:
A failure diagnosis device according to this disclosure diagnoses failure in an object under diagnosis of a device under inspection. The failure diagnosis device comprises: a thermal image processing unit for determining an actually measured temperature by processing thermal image data including an object under diagnosis; a control data processing unit for using control data used to control the device under inspection to determine, as a control temperature, the temperature to be obtained from the control of the device under inspection; a data comparison unit for calculating the temperature difference between the actually measured temperature and control temperature; and a failure diagnosis unit for diagnosing failure in the object under diagnosis on the basis of the temperature difference calculated by the data comparison unit.
More Like This:
| JP3300090 | EXECUTION METHOD FOR TEST PROGRAM |
| JPH05133777 | PLANT FAILURE DIAGNOSTIC DEVICE |
Inventors:
Yuhei Bando
Application Number:
JP2022533002A
Publication Date:
August 14, 2023
Filing Date:
July 03, 2020
Export Citation:
Assignee:
Mitsubishi Electric Corporation
International Classes:
G01D21/00; F24F11/32; F24F11/49
Domestic Patent References:
| JP2010197153A | ||||
| JP201966214A |
Attorney, Agent or Firm:
Patent Attorney Corporation Kisa Patent and Trademark Office
Previous Patent: Elevator door system and its belt grip
Next Patent: CONTROLLER USING CERAMIC OSCILLATOR
Next Patent: CONTROLLER USING CERAMIC OSCILLATOR