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Patent Searching and Data


Title:
FILM DEPOSITION SYSTEM AND FILM DEPOSITION METHOD
Document Type and Number:
Japanese Patent JP2001220672
Kind Code:
A
Abstract:

To provide a film deposition system and a film deposition method which allow the buring film-depositon of a material such as matal on fine holes or grooves, perform uniform wiring formation to the holes or grooves, and simultaneously, form wiring high in a film deposition rate, low in resistivity and having a long life by controlling the material in such a manner that the compositional ratio or orientation thereof controlled to the desired one without deteriorating its properties.

In a film deposition system having a means of feeding gas for exciting plasma into a vessel, an exhausting means for exhausting the gas and reducing the pressure in the vessel and a target electrode, which is arranged in the vessel and is sputtered by the plasma and performing film deposition, onto a substrate disposed oppositely to the target electrode, a structure having a magnet arranged in the vessel or outside the vessel and capable of forming the magnetic field parallel or almost parallel to the surface of the substrate on the surface of the substrate and an electrode capable of applying high frequency on the outer circumference of the substrate at the position the same or almost the same as that of the surface of the substrate is provided.


Inventors:
HIRAYAMA MASAKI
KAIHARA TATSU
NAKAGAWA MASATSUGU
NAKAJIMA KOICHI
TAMURA MOROHISA
OMI TADAHIRO
Application Number:
JP2000363028A
Publication Date:
August 14, 2001
Filing Date:
November 29, 2000
Export Citation:
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Assignee:
OMI TADAHIRO
ULVAC CORP
International Classes:
C23C14/35; H01L21/285; (IPC1-7): C23C14/35; H01L21/285
Domestic Patent References:
JPH03162583A1991-07-12
JPH10251849A1998-09-22
Attorney, Agent or Firm:
Kinichi Kitamura (1 person outside)