Title:
FOREIGN MATTER INSPECTION METHOD AND DEVICE, AND LIGHTING SYSTEM FOR INSPECTING FOREIGN MATTER
Document Type and Number:
Japanese Patent JP2008268236
Kind Code:
A
Abstract:
To provide a foreign matter inspection device capable of detecting opaque foreign matter more precisely compared with that in the prior art, irrespective of a shape and a state in the vicinity of a bottom face of a container.
This foreign matter inspection device acquires an image from a bottom face 2a side of the translucent container 2 formed cylindrically with a bottom, and inspects the presence of the opaque foreign matter in the container, based on the image. The foreign matter inspection device includes the first illumination means 10 for illuminating the container 2 from an upper side thereof, and the second illumination means 20 for illuminating the container 2 from the substantially whole circumference in its outer peripheral side.
Inventors:
MIYATA YASUYO
TAKAHASHI CHIYOKO
MORIZAKI YASUHIKO
TAKAHASHI CHIYOKO
MORIZAKI YASUHIKO
Application Number:
JP2008207824A
Publication Date:
November 06, 2008
Filing Date:
August 12, 2008
Export Citation:
Assignee:
KIRIN TECHNO SYSTEM CO LTD
International Classes:
G01N21/90
Domestic Patent References:
| JPH06160290A | 1994-06-07 | |||
| JP2000180382A | 2000-06-30 | |||
| JPH06294749A | 1994-10-21 |
Attorney, Agent or Firm:
Koji Yamamoto
Kishimoto Tatsuto
Kishimoto Tatsuto