Title:
フロントエンド回路、テストボード、テストシステム、コンピュータおよびプログラム
Document Type and Number:
Japanese Patent JP7189684
Kind Code:
B2
Abstract:
A front-end circuit is used to test an RF signal from an RF device. The RF signal is generated by modulating a carrier signal having a carrier frequency with a wideband baseband signal. A variable frequency oscillator generates a local signal having a variable local frequency. The first frequency mixer frequency mixes a local signal and an RF signal to generate an IF signal having a frequency. A band-pass type first filter filters the IF signal. The local frequency can be selected from a plurality of frequencies having a frequency interval equal to or narrower than a bandwidth of the first filter.
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Inventors:
Koji Asami
Takahiro Kudo
Takahiro Kudo
Application Number:
JP2018101241A
Publication Date:
December 14, 2022
Filing Date:
May 28, 2018
Export Citation:
Assignee:
Advantest Corporation
International Classes:
H04B17/00; H03D7/00; H04L27/26
Domestic Patent References:
| JP200876112A |
Foreign References:
| US4896102 |
Attorney, Agent or Firm:
Morishita Kenki
Yusuke Murata
Tomoyuki Miki
Taiki Maya
Yusuke Murata
Tomoyuki Miki
Taiki Maya