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Title:
ガス分析装置
Document Type and Number:
Japanese Patent JP6810649
Kind Code:
B2
Abstract:
In a gas analysis apparatus including analyzers that need ignition, such as FIDs, in order to make it possible to surely ignite the analyzers while downsizing the entire apparatus, the apparatus includes first and second analyzers 11 and 12 to accept a sample gas, a first gas line L1 provided with the first analyzer 11, a second gas line L2 provided with the second analyzer 12 and joined downstream of the first analyzer 11 in the first gas line L1. At least one of the first analyzer 11 and the second analyzer 12 is configured to cause pressure fluctuations in the gas line L1, L2 including the analyzer 11, 12 when analyzing the sample gas. A first backflow prevention mechanism 21 is disposed between another of the analyzers 12, 11 and a junction X of the gas lines L1 and L2. The first backflow prevention mechanism is configured to prevent a fluid from flowing backward from the one of the analyzers 11, 12 through the junction X toward the another of the analyzers 12, 11.

Inventors:
Shun Fukami
Mobara Haruhisa
Shintaro Aoki
Application Number:
JP2017068980A
Publication Date:
January 06, 2021
Filing Date:
March 30, 2017
Export Citation:
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Assignee:
HORIBA, Ltd.
International Classes:
G01N27/626; G01N21/72
Domestic Patent References:
JP2006284502A
JP8035950A
JP5052755U
JP57007552A
Foreign References:
US20150362468
Attorney, Agent or Firm:
Ryuhei Nishimura
Saito Shindai