Title:
HEATING DEVICE FOR INSPECTION STRUCTURE
Document Type and Number:
Japanese Patent JP2019176818
Kind Code:
A
Abstract:
To provide a heating device for an inspection structure capable of heating while correctly managing temperature of a reagent including an absorbent being an object and temperature of an infection phlogogenic fungus with small energy loss in genetic screening using an inspection structure.SOLUTION: A heating device 1 for an inspection structure has a heating part 10. The heating part 10 includes an IH coil 101. The inspection structure 70 has a fungus crushing processing chamber 74 provided on a partial region in a cylindrical axis direction. A part of the fungus crushing processing chamber 74 is deviated in a D12 direction to an inside-of-cylinder cave part, and a residual part of the fungus crushing processing chamber is stored in the inside-of-cylinder cave part. The part stored in the inside-of-cylinder cave part is induction-heated by the IH coil 101 which receives supply of a high frequency current. The heating device 1 for an inspection structure has an infrared temperature sensor 20 arranged outside of the D12 direction with respect to the heating part 10. The infrared temperature sensor 20 detects temperature of a position deviated in the D12 direction from the inside-of-cylinder cave part on the fungus crushing processing chamber 74.SELECTED DRAWING: Figure 16
Inventors:
MIYAMURA YUKIHARU
Application Number:
JP2018069120A
Publication Date:
October 17, 2019
Filing Date:
March 30, 2018
Export Citation:
Assignee:
DAIKEN IKI KK
International Classes:
C12M1/33; H05B6/10
Attorney, Agent or Firm:
Etsushi Kotani
Masataka Otani
Atsushi Yamamoto
Masataka Otani
Atsushi Yamamoto