Title:
太陽電池モジュールの寿命予測方法
Document Type and Number:
Japanese Patent JP7088487
Kind Code:
B2
Abstract:
To provide a method of predicting a life of a solar cell module that allows life prediction by knowing deterioration over time in whole of an encapsulant in the solar cell module.SOLUTION: A method of predicting a life of a solar cell module, for allowing life prediction of the solar cell module by knowing deterioration over time of an encapsulant in the solar cell module in detail, comprises acquiring a Raman spectrum of the encapsulant obtained by putting a Raman probe to the solar cell module using a movable Raman spectrograph; obtaining a fluorescence intensity ratio from the acquired Raman spectrum of the encapsulant; and, if the fluorescence intensity ratio exceeds a prescribed value, determining that power generation deterioration starts.SELECTED DRAWING: Figure 2
Inventors:
Hidenori Nakahama
Hiroki Iida
Takashi Yasushi
Yasuaki Ishikawa
Hiroki Iida
Takashi Yasushi
Yasuaki Ishikawa
Application Number:
JP2018027611A
Publication Date:
June 21, 2022
Filing Date:
February 20, 2018
Export Citation:
Assignee:
Nisshinbo Mechatronics Co., Ltd.
National University Corporation Nara Institute of Science and Technology
National University Corporation Nara Institute of Science and Technology
International Classes:
H02S50/15; G01N17/00; G01N21/65
Domestic Patent References:
| JP2013093356A | ||||
| JP2011222735A | ||||
| JP2011199276A |
Foreign References:
| US20160233374 |
Other References:
NISHIKAWA, N. et al,Direct observation of changes in the effective minority-carrier lifetime of SiNx-passivated n-type crystalline-silicon substrates caused by potential-induced degradation and recovery tests,Microelectronics Reliability,2017年12月,Volume 79,Pages 91-95,https://www.sciencedirect.com/science/article/pii/S0026271417304882,DOI: 10.1016/j.microrel.2017.10.012
PEIKE, C. et al,Non-destructive degradation analysis of encapsulants in PV modules by Raman Spectroscopy,Solar Energy Materials and Solar Cells,2011年07月,Volume 95, Issue 7,Pages 1686-1693,https://www.sciencedirect.com/science/article/pii/S0927024811000444,DOI: 10.1016/j.solmat.2011.01.030
PEIKE, C. et al,Non-destructive degradation analysis of encapsulants in PV modules by Raman Spectroscopy,Solar Energy Materials and Solar Cells,2011年07月,Volume 95, Issue 7,Pages 1686-1693,https://www.sciencedirect.com/science/article/pii/S0927024811000444,DOI: 10.1016/j.solmat.2011.01.030
Attorney, Agent or Firm:
Kenji Sugimura
Mitsutsugu Sugimura
Kiyoshi Shigeno
Mitsutsugu Sugimura
Kiyoshi Shigeno