Title:
TEST MEASUREMENT SYSTEM AND METHOD FOR ACQUIRING CHARACTERISTIC THEREOF
Document Type and Number:
Japanese Patent JP2017096951
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To correct grain imbalance and skew between IQ base band signals supplied to a DUT.SOLUTION: A signal formation tool 22 generates stimulus signal waveform data expressed by complex numbers. AWGs 24, 26, when receiving the stimulus signal waveform data, respectively generate I and Q base band signals. An oscilloscope 28 receives and captures the I and Q base band signals to generate IQ base band signal waveform data. A pre-compensation coefficient estimation block 30 acquires grain imbalance and skew between the I and Q base band signals of the respective channels (AWGs) from the IQ base band signal waveform data, to thereby acquire frequency response of each channel and generate a pre-compensation coefficient of each channel based on the frequency response. A pre-compensation block 32, when the base band signal used for test is supplied to a device under test, applies the pre-compensation coefficient to the stimulus signal waveform data that is a source of the base band signal.SELECTED DRAWING: Figure 2
Inventors:
BAWA IQBAL G
Application Number:
JP2016226081A
Publication Date:
June 01, 2017
Filing Date:
November 21, 2016
Export Citation:
Assignee:
TEKTRONIX INC
International Classes:
G01R31/3183
Attorney, Agent or Firm:
Yamaguchi International Patent Office
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