PURPOSE: To obtain an equipment of high operating efficiency wherein waiting time between two tests is eliminated, throughput capacity is almost doubled by one handling equipment, and flexible correspondence with the change of a production line is enabled, by installing a first and a second test head parts which are separated in each mechanism and can progress independently test operations.

CONSTITUTION: An IC handling equipment having a first test head part 4 and a second test head part 5 is equipped with the following; an IC mounting stand 1 which mounts IC's for which test is not finished and IC's for which test is finished; a rectangular coordinates type carriage manipulator 3 which is installed above the stand 1 so as to face the IC mounting surface of the stand 1, selectively picks up mounted IC's and carrys them in the direction parallel to the above IC mounting surface, and a first test head part 4 and a second test head part 5 which are installed so as to interpose the carriage manipulator 3 and face each other, equipped with a test robot 6 and a test robot 7, respectively, separated in each mechanism, and can progress independently test operations.