Title:
IC TEST PROGRAM INSPECTING DEVICE AND INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2004085345
Kind Code:
A
Abstract:
To provide an IC test program inspecting device which can inspect plural kinds of IC inspection programs, in the same IC test program inspection device and IC test device.
Inspection information 60 of the IC test program, which does not depend on the IC test program and to which an application program 50 refers, is built inside of the IC test program inspecting device 30. By having the application program 50 refer to it and transmit a control signal to the IC test device 40, to control the IC test device 40, the IC test program inspection is conducted.
Inventors:
HATSUTORI HIRONAO
Application Number:
JP2002246314A
Publication Date:
March 18, 2004
Filing Date:
August 27, 2002
Export Citation:
Assignee:
ANDO ELECTRIC
International Classes:
G01R31/28; G01R35/00; (IPC1-7): G01R35/00; G01R31/28
Attorney, Agent or Firm:
Noriaki Miyakoshi
Teruo Naito
Teruo Naito
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