INFRARED IMAGE INSPECTING DEVICE

Japanese Patent JP3268250

B2

PROBLEM TO BE SOLVED: To provide an infrared image inspecting device capable of inspecting defect parts such as cavities, cracks, present in an object even in a complicated shape and easily obtaining satisfactory detectability.
SOLUTION: An infrared image inspecting device is constituted of a placing platform of an object to be inspected, a plurality of sensors 15 to measure distances to the object to be inspected, a heater 54 to heat the object to be inspected, an infrared camera 51, an infrared image signal processing displaying device 52, and a controller 10 to control these instrument. The location of placement and the angle of placement of the object to be inspected are adjustable in the placing platform, and the sensors 15 are movable vertically with respect to the direction of observation of the infrared camera 51. From measured values by the distance sensors 15, etc., the location and the inclination of the object are indicated by a controller 10, and an inclining and rotating table, etc. are operated by the controller 10 to control the movement and the inclination of the object on the placing platform. Therefore, it is possible to inspect an object even in a distorted shape properly.

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WO/2013/083846	METHOD FOR EXAMINATION OF A SAMPLE BY MEANS OF THE HEAT FLOW THERMOGRAPHY
JPH05240815	METHOD AND DEVICE FOR INDUCTION HEATING FLAW DETECTING

Iwao Abe
Hisahiko Aoki
Yasuo Araki
Rintaro Chizu
Yoshiyuki Nishiguchi

JP33563097A

March 25, 2002

December 05, 1997

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Tohoku Electric Power Co., Inc.
MITSUBISHI HEAVY INDUSTRIES,LTD.

G01N25/72; (IPC1-7): G01N25/72

JP6478138A
JP341307A
JP4148309A
JP4175649A
JP4279850A
JP383853U

Arata Ishikawa (1 person outside)

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