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Patent Searching and Data


Title:
INSPECTION APPARATUS
Document Type and Number:
Japanese Patent JP2008039452
Kind Code:
A
Abstract:

To perform an inspection without increasing the number of measuring instruments, when inspecting a plurality of instruments to be inspected using a plurality of measuring instruments, thereby reducing equipment for inspection.

An inspection apparatus 2 for performing a plurality of different items of inspection for the plurality of instruments 14 to be inspected using the plurality of measuring instruments 16 includes a relay box 8 (switching-connecting means) involving relay contact point groups 44a, 44b, etc., for switching-connecting each measuring instrument 16 to the instruments 14 individually, a personal computer 6 (control means) for controlling the switching-connecting among the switching-connecting means 42 and 44. The switching-connecting motion among the relay contact point groups 44a, 44b is controlled with the personal computer 6, and the inspection for each instrument 14 is individually parallel executed using a different kinds of measurement instruments.


Inventors:
HIRASAWA TAKAHIRO
FUJIMASA TOMOO
KURAHASHI MASASHI
MIZUNO SHINJI
INOUE MAKOTO
OKAMOTO SHINJI
Application Number:
JP2006210645A
Publication Date:
February 21, 2008
Filing Date:
August 02, 2006
Export Citation:
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Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
G01R31/00
Attorney, Agent or Firm:
Kazuhide Okada