Title:
INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION PROGRAM
Document Type and Number:
Japanese Patent JP2015105888
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an inspection device, an inspection method, and an inspection program for appropriately quantifying in two quantification parts differing in capacity.SOLUTION: The inspection device rotates an inspection chip provided with a sample quantification part in which a sample is quantified and a reagent quantification part in which a reagent is quantified in a revolution direction that is the direction of rotation around a first axis, causing a centrifugal force to act on the sample and the reagent, and rotates the inspection chip in an autorotation direction that is the direction of rotation around a second axis different from the first axis, causing the direction of the centrifugal force to change. A CPU of the inspection device causes the reagent to be injected into the reagent quantification part by rotating the inspection chip in the autorotation direction by an autorotation speed VA (S19). The CPU causes the sample to be injected into the sample quantification part whose capacity is smaller than that of the reagent quantification part by rotating the inspection chip in the autorotation direction at autorotation speeds VC, VD slower than the autorotation speed VA (S31, S35).
Inventors:
OSHIKA YUMIKO
YOSHIMURA CHISATO
YOSHIMURA CHISATO
Application Number:
JP2013248590A
Publication Date:
June 08, 2015
Filing Date:
November 29, 2013
Export Citation:
Assignee:
BROTHER IND LTD
International Classes:
G01N35/00; B81B1/00; G01N35/08; G01N37/00
Domestic Patent References:
| JP2013205283A | 2013-10-07 | |||
| JP2009121912A | 2009-06-04 | |||
| JP2012078107A | 2012-04-19 | |||
| JP2012013553A | 2012-01-19 |
Foreign References:
| US20050026301A1 | 2005-02-03 |
Attorney, Agent or Firm:
Hisashi Yamamoto
Tomohiro Inayama
Tomohiro Inayama