Title:
INSPECTION JIG FOR MULTIPOLE ELECTRON DEVICE
Document Type and Number:
Japanese Patent JP2833287
Kind Code:
B2
Abstract:
PURPOSE: To realize the improvement of productivity by checking the total number of pins as an electron device and inspecting whether or not a bend of the pin exceeds a prescribed value by one-touch.
CONSTITUTION: An electron device mounting board 51 is consisting of an opaque resin in which through holes 51a of diameter capable of covering the tip dispersion in a prescribed bending value of pin or terminal protruding from an electron device are formed. A light detecting part 52 is connected to the mounting board 51 through an optical fiber cable 54 of multi-fiber, and a light receiving element 52b situated in the detector 52 exchanges signals with a display part 53. Each end part of the optical fiber 54b separated each other forming one end of the cable 54 is fixed at each prescribed position of holes 51a of the mounting board 51. The cut surfaces 54a are arranged to face the element 52b located inside the light intercepted detecting part 52. Thus monitoring can be performed by display lamps 53a, 53b of the display part 53, productivity can be improved by checking the total number of pins and inspecting whether or not there is a bend of the pins exceeding a prescribed value with one-touch operation.
Inventors:
FUTAKI KAZUYUKI
KOBAYASHI KIMIO
MYAO NAOE
KOBAYASHI KIMIO
MYAO NAOE
Application Number:
JP24207891A
Publication Date:
December 09, 1998
Filing Date:
September 20, 1991
Export Citation:
Assignee:
FUJITSU KK
International Classes:
G02B6/00; G01R31/04; H01R43/00; (IPC1-7): H01R43/00; G01R31/04; G02B6/00
Domestic Patent References:
| JP6483163A |
Attorney, Agent or Firm:
Teiichi