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Title:
膜電極接合体の検査方法および検査装置
Document Type and Number:
Japanese Patent JP7299260
Kind Code:
B2
Abstract:
An inspection method of a membrane electrode assembly includes a first process of acquiring an X-ray transmission image of the membrane electrode assembly, a second process of identifying a luminance-reduced region having a luminance lower than a luminance of a surrounding region in the X-ray transmission image acquired in the first process, a third process of correcting the luminance of the luminance-reduced region identified in the second process, in accordance with a planar size of the luminance-reduced region, based on a correlation between a planar size of a foreign matter in the membrane electrode assembly and change in luminance due to diffraction of X-rays, and a fourth process of finding a thickness of the foreign matter in the membrane electrode assembly based on the luminance corrected in the third process.

Inventors:
Shinya Takeshita
Application Number:
JP2021041216A
Publication Date:
June 27, 2023
Filing Date:
March 15, 2021
Export Citation:
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Assignee:
TOYOTA JIDOSHA KABUSHIKI KAISHA
Hitachi High-Tech Science Co., Ltd.
International Classes:
H01M8/1004; G01B15/02; G01N23/04; G01N23/18
Domestic Patent References:
JP2021135125A
JP2009168740A
JP2010286405A
JP2006125875A
JP2011085518A
Foreign References:
WO2017183493A1
Attorney, Agent or Firm:
Patent Attorney Corporation Meisei International Patent Office