Title:
INSPECTION SUPPORT DEVICE AND METHOD
Document Type and Number:
Japanese Patent JP2020123284
Kind Code:
A
Abstract:
To improve a work efficiency of an inspection work for detecting a defect of a product in a production machine that manufactures products.SOLUTION: In a production machine 100 for manufacturing products, an inspection support device 20 for supporting an inspection work for detecting a defect of a product 10 includes: an acquisition unit 26 that acquires defect information specifying a location where the defect of the product 10 exists and a type of the defect; recognition units 24, 25 that recognize a product sample 10b; and a display unit 22 that displays the defect information superimposed on the sample 10b or an image of the sample 10b.SELECTED DRAWING: Figure 1
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Inventors:
OGAWA MASAYASU
SHOJI YASUYUKI
TAKEMOTO SHUICHI
FUKUSHIGE NAOYUKI
SHIMOHATSUBO MAKOTO
SHOJI YASUYUKI
TAKEMOTO SHUICHI
FUKUSHIGE NAOYUKI
SHIMOHATSUBO MAKOTO
Application Number:
JP2019016346A
Publication Date:
August 13, 2020
Filing Date:
January 31, 2019
Export Citation:
Assignee:
MITSUBISHI HEAVY IND MACH SYSTEMS LTD
International Classes:
G05B19/418; G06F3/0484; G06Q50/04; G06T19/00
Domestic Patent References:
| JP2014198465A | 2014-10-23 | |||
| JP2017120556A | 2017-07-06 | |||
| JP2014235704A | 2014-12-15 | |||
| JPH08220012A | 1996-08-30 | |||
| JP2016061603A | 2016-04-25 | |||
| JP2015045942A | 2015-03-12 |
Attorney, Agent or Firm:
Yu Sanada