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Title:
レーザ光コヒーレンス長測定方法及び測定装置
Document Type and Number:
Japanese Patent JP5470320
Kind Code:
B2
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Inventors:
Masaaki Inoue
Fumihiko Ito
Application Number:
JP2011097259A
Publication Date:
April 16, 2014
Filing Date:
April 25, 2011
Export Citation:
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Assignee:
Nippon Telegraph and Telephone Corporation
International Classes:
G01J9/00
Domestic Patent References:
JP2012112657A
JP2010139253A
JP2006343226A
Foreign References:
WO2007034721A1
Other References:
INOUE,M. 他,“Coherence characterization of narrow-linewidth beam by C-OFDR based Rayleigh speckle analysis”,Optics Express,2011年 9月26日,Volume 19, Issue 21,Pages 19790-19796
井上雅晶 他,“C-OFDRによる後方散乱統計解析を用いたレーザのコヒーレンス評価”,電子情報通信学会ソサイエティ大会講演論文集,2011年 8月30日,2011年通信(2),Page 356 [B-13-19]
Attorney, Agent or Firm:
Kurata Masatoshi
Toshizo Koide
Takashi Mine
Nobuhisa Nogawa



 
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