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Title:
LASER DIODE STRUCTURE WITH TEMPERATURE-CONTROLLED BEAM SHAPING ELEMENT AND METHOD FOR GAS DETECTION BY MEANS OF LASER DIODE STRUCTURE
Document Type and Number:
Japanese Patent JP2011101003
Kind Code:
A
Abstract:

To provide a laser diode structure that improves sensitivity of detection of a gas by reducing interference of a laser beam.

The laser diode structure 1 for use in gas detection includes a hermetically sealed casing 2 having an electric coupling portion 3, a bottom portion 4 and a window 5. A laser diode chip 6 and temperature control portions 9, 12 for the chip are provided in the casing 2. A thermoelectric element 12 serving as a Peltier element as a part of the temperature control portions is coupled to the bottom portion 4 of the casing 2 through a bottom surface 13, and coupled to the laser chip 6 through an upper surface 11. A temperature-controlled beam shaping member 14 which is provided between the diode chip 6 and window 5 and dims the laser beam 7, emitted from an opening of the laser diode chip 6, in parallel before the laser beam 7 passes through the window 5. The beam shaping member 14 in contact with the laser diode chip 6 is preferably in surface-to-surface contact with or bonded to the opening 8 through its boundary surface 16, or formed integrally with the opening 8.


Inventors:
WILLING BERT
PROTASIO RUI
GAILLARD MATHIEU
Application Number:
JP2010240601A
Publication Date:
May 19, 2011
Filing Date:
October 27, 2010
Export Citation:
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Assignee:
LEISTER PROCESS TECH
International Classes:
H01S5/022
Domestic Patent References:
JP2009515159A2009-04-09
JP2002185071A2002-06-28
JP2006128217A2006-05-18
JP2001264662A2001-09-26
JPS5187984A1976-07-31
JPS5538065A1980-03-17
JPH08247939A1996-09-27
JP2009515159A2009-04-09
JP2002185071A2002-06-28
JP2006128217A2006-05-18
JPH09307144A1997-11-28
Foreign References:
WO1997040558A11997-10-30
Attorney, Agent or Firm:
Hiroyuki Niwa
Nishio Mira