LASER RESONANCE IONIZATION MASS SPECTROMETER

Title:

LASER RESONANCE IONIZATION MASS SPECTROMETER

Document Type and Number:

Japanese Patent JP2011040319

Kind Code:

A

Abstract:

To provide a laser resonance ionization mass spectrometer for reducing the influences of ions of other gas than gas to be analyzed on detection signals.

When mixed gas consisting of cover gas introduced into an ionizing chamber and tag gas is irradiated between ion extraction electrodes 8112a, 8112b with laser beams 83 to apply resonance excitation-ionization to the tag gas, the cover gas is ionized in non-resonance reaction with photoelectrons or others emitted from the dispersed laser beams and produced in a wide range between control electrodes and tag gas ions to be analyzed are produced along the irradiation laser beams. Focusing on the fact, an ion extraction window 8112b1 of the ion extraction electrode 8112b is slit-shaped along the passage of the laser beams to suppress the extraction of cover gas ions.

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Inventors:

IWATA YOSHIHIRO
ARAKI YOSHIO
ITO CHIKARA
HARANO HIDEKI
AOYAMA TAKUJI
ARIMA SATOHIRO

Application Number:

JP2009188331A

Publication Date:

February 24, 2011

Filing Date:

August 17, 2009

Export Citation:

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Assignee:

JAPAN ATOMIC ENERGY AGENCY

International Classes:

H01J49/10; G01N27/62; G01N27/64; H01J49/06

Domestic Patent References:

JP2876699B2	1999-03-31
JPH11218521A	1999-08-10

Attorney, Agent or Firm:

Yukihiko Takada
Hiroyuki Hashimoto

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