LEARNING DEVICE, ABNORMAL SIGN DETECTION DEVICE, ABNORMAL SIGN DETECTION SYSTEM, LEARNING METHOD, AND PROGRAM

Title:

LEARNING DEVICE, ABNORMAL SIGN DETECTION DEVICE, ABNORMAL SIGN DETECTION SYSTEM, LEARNING METHOD, AND PROGRAM

Document Type and Number:

Japanese Patent JP2023109769

Kind Code:

A

Abstract:

To provide a learning device capable of improving detection accuracy of abnormal signs.SOLUTION: A learning device 1 disclosed herein is for generating learned data to be used for detecting abnormal signs, and is configured to perform normal waveform learning using normal data, or data that is normal, and abnormal sign waveform learning using abnormal sign data, or data with abnormal signs, to generate learned data.SELECTED DRAWING: Figure 1

More Like This:

JP6573330	Coulomb amount measuring device
WO/2023/160968	METHOD FOR OPERATING AN ELECTRONIC CIRCUIT BREAKER, ELECTRONIC CIRCUIT BREAKER, AND ELECTRIC SYSTEM COMPRISING AN ELECTRONIC CIRCUIT BREAKER
JPS60249071	DEVICE AND METHOD FOR SENSING AND POSITION-DETECTING INFORMATION RELATED TO OCCURRENCE

Inventors:

SAKO TOMOO

Application Number:

JP2023073761A

Publication Date:

August 08, 2023

Filing Date:

April 27, 2023

Export Citation:

Click for automatic bibliography generation Help

Assignee:

MITSUBISHI ELECTRIC CORP

International Classes:

G01R31/08; G06N20/00; H02H3/347; H02H3/38

Attorney, Agent or Firm:

Jun Takamura

Previous Patent: self-adhesive foam sheet

Next Patent: Mounting substrates, electronic devices, and electronic modules