Title:
高空間解像度でサンプル中の構造を局所的に画像化すること
Document Type and Number:
Japanese Patent JP6730895
Kind Code:
B2
Abstract:
For high spatial resolution imaging a structure in a sample, the structure being marked with luminescence markers, light that has an effect on the emission of luminescence light by the luminescence markers is directed onto the sample with an intensity distribution having a zero point and intensity maxima neighboring the zero point in at least one direction. A scan area which is a part of the sample is scanned with the zero point. Luminescence light emitted out of a local area including the zero point is registered and assigned to the respective location of the zero point in the sample. Dimensions of the scan area, in at least one direction in which the intensity maxima are neighboring the zero point, are limited such that they are not larger than 75% of a distance of the intensity maxima in the at least one direction.
Inventors:
Stephen W. Hell
Fabian Gottfeld
Volker West Fal
Fabian Gottfeld
Volker West Fal
Application Number:
JP2016184831A
Publication Date:
July 29, 2020
Filing Date:
September 21, 2016
Export Citation:
Assignee:
Max-Plank-Gezelle Shaft Tool Verderungk Del Wissenschafften A. Fau.
International Classes:
G01N21/64; G02B21/06; G02B21/36
Domestic Patent References:
| JP2015072462A | ||||
| JP2007322417A |
Foreign References:
| WO2012171999A1 |
Attorney, Agent or Firm:
▲吉▼川 俊雄
Kana Ichikawa
Kana Ichikawa