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Title:
MALDIイオントラップ型質量分析装置及び分析方法
Document Type and Number:
Japanese Patent JP4701720
Kind Code:
B2
Abstract:

To provide a method and apparatus configuration which cover a wider range of mass dimensions by a single measurement in the MALDI ion trap type mass spectrometer.

A testpiece is irradiated with pulsed laser more than once while changing little by little a time duration between irradiation time t0 of pulsed laser in the MALDI section and period of time t1 when RF voltage is applied to a ring electrode attached in the ion trap section. Subsequently, summing or summing averaging is taken about the resultant mass spectrum obtained in this way. The shorter a time duration between t0 and t1 is, the more often the ion with smaller mass/charge ratio tends to be trapped into the ion trap space 122. A method of making the measurements a lot of times by shifting a time duration in this way thereby allows mass spectrum covering a wider range of mass dimensions to be obtained.

COPYRIGHT: (C)2006,JPO&NCIPI


Inventors:
Shinichi Iwamoto
Application Number:
JP2005003279A
Publication Date:
June 15, 2011
Filing Date:
January 11, 2005
Export Citation:
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Assignee:
SHIMADZU CORPORATION
International Classes:
H01J49/26; G01N27/62; G01N27/64; H01J49/16; H01J49/40
Domestic Patent References:
JP2003530675A
JP7161336A
JP2001307675A
JP2004303719A
JP2004214077A
Attorney, Agent or Firm:
Kyoto International Patent Office
Ryouhei Kobayashi