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Title:
MACRO LIGHTING SYSTEM FOR VISUAL INSPECTION APPARATUS, VISUAL INSPECTION APPARATUS, AND VISUAL INSPECTION METHOD OF GLASS SUBSTRATE
Document Type and Number:
Japanese Patent JP2008170207
Kind Code:
A
Abstract:

To provide a macro lighting system, a visual inspection apparatus, and a visual inspection method of a substrate capable of irradiating a substrate to be inspected at a uniform brightness with a plurality of light sources by adjusting the brightness of the illumination light emitted from the plurality of light sources.

The macro lighting system comprises a plurality of light source units 4a and 4b for emitting the illumination light F. The light source units 4a and 4b have a light source 8 for emitting the illumination light F, and a dimming means 9 for adjusting light. With reference to the brightness of the illumination light F emitted from one of the plurality of light source units 4a and 4b, the dimming means 9 adjusts the brightness of the illumination light F emitted from the others of the light sources 4a and 4b to provide substantially equal brightness.


Inventors:
NISHIZAWA MAKOTO
Application Number:
JP2007002145A
Publication Date:
July 24, 2008
Filing Date:
January 10, 2007
Export Citation:
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Assignee:
OLYMPUS CORP
International Classes:
G01N21/84; G01N21/958
Domestic Patent References:
JP2001091469A2001-04-06
JP2006194896A2006-07-27
JP2004335199A2004-11-25
JPH09273996A1997-10-21
JPH01297534A1989-11-30
JPH09204050A1997-08-05
JP2006006803A2006-01-12
Attorney, Agent or Firm:
Sumio Tanai
Masatake Shiga
Masakazu Aoyama
Suzuki Mitsuyoshi
Tadao Takashiba
Hiroshi Masui