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Title:
MANUFACTURE OF SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JPS54152478
Kind Code:
A
Abstract:

PURPOSE: To realize free and well-reproducible control of the impurity distribution of cathode region of a super-stair-case junction part which can not be performed by a conventional method, by repeating epitaxial growth and selective diffusion.

CONSTITUTION: On N+-type Si substrate 11, N epitaxial layer 12 is stacked and SiO2 film 13 is provided with an opening, where N+ layer 14 is formed. It is recommended to use, especially, Sb and As small in diffusion coefficient. After film 13 is removed, epitaxial layer 17 is formed by vapor-phase growth and SiO2 mask 13' is used to form N-type diffusion layer 18 right over layer 14. Under various conditions, layers 14 and 18 can be made N+ layers of complex distribution by combining various impurities. Further, an element with super-staircase junction can be formed by forming P+ layer 15 in the same region. Consequently, mass-production can be realized with good reproducibility and uniformity of various characteristics of a varactor diode.


Inventors:
MIHASHI GUNJI
Application Number:
JP6149378A
Publication Date:
November 30, 1979
Filing Date:
May 22, 1978
Export Citation:
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Assignee:
NIPPON ELECTRIC CO
International Classes:
H01L29/93; H01L21/20; H01L21/205; H01L21/22; H01L21/225; (IPC1-7): H01L21/20; H01L21/22; H01L29/93
Domestic Patent References:
JP39013172A
JPS4826195A1973-04-05



 
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