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Title:
MASKING DEPOSITION METHOD
Document Type and Number:
Japanese Patent JPS5462984
Kind Code:
A
Abstract:

PURPOSE: To obtain a product of improved pattern preciseness in a good yield, by controlling angle of incidence of evaporated material, which is to be deposited on the substrate, between the evaporation source and the mask placed on the substrate.

CONSTITUTION: In depositing metal 3 in vacuum on a substrate 1 through a metal mask 2, evaporated material is made to fall upon the substrate 1 with its angle of incidence controlled. The angle of incidence is controlled by the incidence of the evaporated material through a cylinder 5 or a slit 6 placed between the mask 2 and evaporation source 3. The cylinder 5 or the slit 6 may be remolved together with the substrate 1, or allowed to stand still. This method effects deposition with excellent pattern preciseness even when plural substrates are subjected to simultaneous masking deposition while the substrates revolving.


Inventors:
INOUE KOUICHI
YASUDA TOMIROU
FUNIYUU MASAO
Application Number:
JP11594878A
Publication Date:
May 21, 1979
Filing Date:
September 22, 1978
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
C23C14/04; H01L21/285; (IPC1-7): C23C13/06; H01L21/285
Domestic Patent References:
JP38024220A
JP39004785A
JPS462002A
JP49099843B
JPS49118681A1974-11-13