サンプル中の元素の質量分析方法、該質量分析方法に用いる分析用デバイス、および、サンプル捕捉用キット

Title:

サンプル中の元素の質量分析方法、該質量分析方法に用いる分析用デバイス、および、サンプル捕捉用キット

Document Type and Number:

Japanese Patent JP7199054

Kind Code:

B2

Abstract:

To provide an analysis method which does not need to switch to a measuring element solution in the middle of analysis of a sample, an analysis device used for the analysis method, and a sample capturing kit for capturing the sample in a sample capturing region of the analysis device.SOLUTION: A mass analysis method of an element in a sample includes: a sample capturing process of capturing the sample in an analysis device 1; a measuring element measurement process of measuring a measuring element 3 provided in the analysis device in advance and containing a prescribed amount of an element; an element-in-sample measurement process of measuring the element contained in the sample captured in the sample capturing process; and an element-in-sample analysis process of analyzing an amount of the element contained in the sample from the measurement result of the measuring element measurement process and the measurement result of the element-in-sample measurement process.SELECTED DRAWING: Figure 1

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Inventors:

Takao Yasui
Baba Yoshinobu
Motohide Aoki
Tomoya Umemura

Application Number:

JP2018210123A

Publication Date:

January 05, 2023

Filing Date:

November 07, 2018

Export Citation:

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Assignee:

Tokai National University Organization
Tokyo Pharmaceutical University

International Classes:

G01N27/62; G01N1/00

Domestic Patent References:

JP2008268221A
JP2007529001A
JP2018508752A
JP2008542712A
JP2007055293A1

Foreign References:

WO2004003531A1

Attorney, Agent or Firm:

Seiji Matsumoto

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