To carry out structural analysis of molecules by selecting target ions with a high mass resolution and analyzing ion fragments generated by cleaving the target ions.
Various kinds of ion generated at an ion source 1 are put on a revolving track P, differences of the target ion and the other kinds of ion are enlarged during the process of revolution, and unnecessary kinds of ion are discarded out of the track by a deflection electrode. Thereby, the target ion alone is left on the track with a high mass resolution, and a higher performance is realized with a function virtually equal to ion trapping. The target ion of high purity thus stored is turned aside from the track P, led to a second flight space 6 after being cleaved at a cleaving region 4, and is folded back with a reflector 7 at a position corresponding to the number of mass to be detected with a detector 8.
| JP2015165229 | ANALYSIS METHOD |
| JPS5853748 | [Title of the Invention] Digital Sousa souchi |
| WO/2020/110264 | MASS SPECTROMETER |
ISHIHARA MORIO
TOYODA MICHISATO
OKUMURA DAISUKE
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