Title:
計測方法、計測装置、計測システム及び計測プログラム
Document Type and Number:
Japanese Patent JP7396139
Kind Code:
B2
Abstract:
A measurement method includes: a step of acquiring first observation point information including a time point when each part of an m-th moving object passes a first observation point and a physical quantity which is a response to an action; a step of acquiring second observation point information including a time point when the each part passes a second observation point and a physical quantity which is a response to an action; a step of calculating a deflection waveform of a structure generated by the each part; a step of adding the deflection waveforms to calculate an m-th moving object deflection waveform; a step of calculating a displacement waveform at the third observation point; and a step of calculating first to M-th amplitude coefficients by assuming that a waveform obtained by multiplying an m-th amplitude coefficient by the m-th moving object deflection waveform is an m-th amplitude adjusted deflection waveform, and that a sum of first to M-th amplitude adjusted deflection waveforms is approximated to the displacement waveform.
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Inventors:
Yoshihiro Kobayashi
Application Number:
JP2020047308A
Publication Date:
December 12, 2023
Filing Date:
March 18, 2020
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
G01M5/00; E01D22/00; G01B21/00; G08G1/015
Domestic Patent References:
| JP2018066637A | ||||
| JP2017058177A | ||||
| JP2017020796A | ||||
| JP2006084404A | ||||
| JP2012048365A | ||||
| JP2010197249A |
Foreign References:
| US20150316426 | ||||
| US20120173171 | ||||
| CN107357983A |
Attorney, Agent or Firm:
Satoshi Nakai
Hiroki Matsuoka
Masayuki Imamura
Hiroki Matsuoka
Masayuki Imamura
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