Title:
MEASUREMENT SUPPORT DEVICE, MEASUREMENT SUPPORT METHOD, MEASUREMENT SUPPORT SYSTEM, AND PROGRAM
Document Type and Number:
Japanese Patent JP2015167673
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a measurement support device, a measurement support method, a measurement support system, and a program, which are capable of positioning a measured portion at an appropriate position of a measurement apparatus with accuracy.SOLUTION: A measurement support device 1 of the present invention comprises an image acquisition unit 11, an image generation unit 12, and a display unit 13.The image acquisition unit 11 acquires an apparatus image including the measurement apparatus. The image generation unit 12 generates a superimposed image that is obtained by superimposing a guide image for guiding the measured portion to a measurement position on the measurement apparatus, with the apparatus image on the basis of the apparatus image. The display unit 13 displays the superimposed image.
Inventors:
OISHI AKIO
Application Number:
JP2014043930A
Publication Date:
September 28, 2015
Filing Date:
March 06, 2014
Export Citation:
Assignee:
NEC PLATFORMS LTD
International Classes:
A61B5/00
Domestic Patent References:
| JP2006000180A | 2006-01-05 | |||
| JP2010284239A | 2010-12-24 | |||
| JP2005013597A | 2005-01-20 | |||
| JP2005237861A | 2005-09-08 | |||
| JP2009056238A | 2009-03-19 |
Foreign References:
| US20150230751A1 | 2015-08-20 |
Attorney, Agent or Firm:
Ken Ieiri
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