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Title:
MEASURING APPARATUS, MEASURING METHOD, AND PROGRAM
Document Type and Number:
Japanese Patent JP2013040902
Kind Code:
A
Abstract:

To dramatically improve measuring speed.

A retrieval unit 53 retrieves an extreme value which is a maximum value or a minimum value from among first measured values measured at measuring points set at a first interval in a frequency direction. A measurement control unit 52 controls a measurement unit 31, and causes the measurement unit 31 to perform measurement in a frequency range including the extreme value retrieved from the first measured values, at a predetermined number of measuring points set at a predetermined second interval which is narrower than the first interval. The retrieval unit 53 retrieves an extreme value which is a maximum value or a minimum value from among second measured values measured at measuring points set at the second interval. A quadrant frequency measuring point adding unit 55 sets a predetermined number of measuring points set at a predetermined third interval which is narrower than the first interval, for a frequency range including a quadrant frequency of a frequency of the extreme value retrieved from the second measured values. The present invention can be applied to an impedance analyzer.


Inventors:
TANAKA HIDEAKI
HARUHARA MASASHI
Application Number:
JP2011179742A
Publication Date:
February 28, 2013
Filing Date:
August 19, 2011
Export Citation:
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Assignee:
HIOKI ELECTRIC WORKS
International Classes:
G01R23/16; G01R27/28; G01R29/22
Domestic Patent References:
JP2006052996A2006-02-23
JP2005062045A2005-03-10
JP2007509328A2007-04-12
JP2007071722A2007-03-22
Attorney, Agent or Firm:
Iat International Patent Business Corporation