Title:
MEASURING INSTRUMENT WITH HIGH MEASUREMENT ACCURACY
Document Type and Number:
Japanese Patent JP2014134539
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a measuring instrument with high measurement accuracy.SOLUTION: In a measuring instrument with high measurement accuracy, a slide moving device 35 in a measurement set 32 includes a slide rail 351 installed on a machine base 31 and a slide base 352 movable on the slide rail 351. Slide tubs 3511 are opened at both sides of the slide rail 351. On the slide base 352, fitting parts 3521 are formed which are fitted into the slide tubs 3511. On the fitting parts 3521 and on surfaces in contact with the slide tubs 3511, a plurality of rolling balls 3522 are fitted and installed. The fitting parts 3521 on the slide base 352 and the slide tubs 3511 on the slide rail 351 are correspondent to each other, such that the slide base 352 can be accurately and smoothly moved. Further, together with assistance of a holding device 33, effects of stably supporting an article 4 to be measured are achieved. Thus, data measured and obtained by a measurement device can achieve higher accuracy.
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Inventors:
LIU GUOSHENG
Application Number:
JP2013268046A
Publication Date:
July 24, 2014
Filing Date:
December 25, 2013
Export Citation:
Assignee:
SHENG KUO MACHINERY CO LTD
International Classes:
G01B21/00; G01B5/00
Domestic Patent References:
| JP2005249431A | 2005-09-15 | |||
| JPS59108205U | 1984-07-21 | |||
| JPH0354411A | 1991-03-08 | |||
| JP2005249431A | 2005-09-15 | |||
| JPS59108205U | 1984-07-21 | |||
| JPH0354411A | 1991-03-08 |
Attorney, Agent or Firm:
Harakenzo world patent & trademark
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