Title:
MEASURING METHOD, MEASURING DEVICE, MEASURING SYSTEM, AND MEASURING PROGRAM
Document Type and Number:
Japanese Patent JP2021148535
Kind Code:
A
Abstract:
To provide a measuring method that can calculate a deflection waveform of a structure caused by a movable body that moves on the structure without measuring displacement of the structure.SOLUTION: A measuring method includes the steps of: acquiring first observation point information; acquiring second observation point information; adding or subtracting the time of a first ratio relative to a transit time between a first observation point and a second observation point to or from the time at which parts of a movable body pass through the first observation point to update the first observation point information, and adding or subtracting the time of a second ratio relative to the transit time to or from the time at which parts of the movable body pass through the second observation point to update the second observation point information; calculating deflection waveforms of a structure caused by the parts based on the updated first observation point information and second observation point information, a predetermined coefficient, and a formula obtained by squaring an approximate expression of deflection of the structure; and adding the deflection waveforms to calculate a deflection waveform of the structure caused by the movable body.SELECTED DRAWING: Figure 23
Inventors:
KOBAYASHI SACHIHIRO
Application Number:
JP2020047307A
Publication Date:
September 27, 2021
Filing Date:
March 18, 2020
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
G01M5/00; G01B21/00; G08G1/015
Attorney, Agent or Firm:
Kazuaki Watanabe
Satoshi Nakai
Hiroki Matsuoka
Satoshi Nakai
Hiroki Matsuoka