Title:
MEASURING METHOD, MEASURING DEVICE, MEASURING SYSTEM, AND MEASURING PROGRAM
Document Type and Number:
Japanese Patent JP2021148537
Kind Code:
A
Abstract:
To provide a measuring method that can calculate a deflection waveform of a structure while considering a difference in load between the stationary period and the moving period of a movable body.SOLUTION: A measuring method includes the steps of: by using first observation point information, based on the time from a leading time at which the leading part of a movable body passes through a first observation point until the times at which parts pass through the first observation point, and the time from the leading time until the time to distribute the total sum of first physical quantities that are responses to actions of the parts on the first observation point at a predetermined distribution ratio, calculating a correction coefficient for correcting the first physical quantities; calculating deflection waveforms of a structure caused by the plurality of parts based on the first observation point information and second observation point information, a predetermined coefficient, the correction coefficient, and an approximate expression of deflection of the structure; and adding the deflection waveforms of the structure to calculate a deflection waveform of the structure caused by the movable body.SELECTED DRAWING: Figure 26
Inventors:
KOBAYASHI SACHIHIRO
Application Number:
JP2020047309A
Publication Date:
September 27, 2021
Filing Date:
March 18, 2020
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
G01M5/00; E01D22/00; G01B21/00; G08G1/015
Attorney, Agent or Firm:
Kazuaki Watanabe
Satoshi Nakai
Hiroki Matsuoka
Satoshi Nakai
Hiroki Matsuoka