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Patent Searching and Data


Title:
MEASURING METHOD FOR REFLECTION FACTOR OF OPTICAL ANISOTROPIC SUBSTANCE
Document Type and Number:
Japanese Patent JPH01150841
Kind Code:
A
Abstract:
PURPOSE:To obtain an effect being equal to the time when a polarizing plate is rotated without correcting an output voltage from a photoelectric converter by inserting a 1/4lambda inspecting plate on an optical path of a reflected light from the surface of a sample. CONSTITUTION:A light beam from a light source 12 is polarized by a polarizing plate 11 and radiated on a sample 1. A 1/4lambda inspecting plate 13 is provided in order to give a phase difference to a reflected light from the sample 1 and to color a sample image. When the 1/4lambda inspecting plate 13 is rotated, the same effect as the case when the polarizing plate 11 is rotated is obtained. Therefore, the 1/4lambda inspecting plate 13 which is attached to a rotary mechanism is rotated by a 1/4lambda inspecting plate rotation control circuit 14 controlled by a sequence control circuit 7. In such a way, when the 1/4lambda inspecting plate 13 is rotated, a complicated operation for correcting an output voltage from a photoelectric converter 4 in accordance with a variation of a rotational angle of the polarizing plate 11 as in case when the polarizing plate 11 is rotated becomes unnecessary. In such a way, an effect being equal to when the polarizing plate is rotated without correcting the output voltage from the photoelectric converter can be obtained.

Inventors:
KATO TOMONORI
KAMOSHITA TOMOO
NEMOTO KENICHI
Application Number:
JP30851287A
Publication Date:
June 13, 1989
Filing Date:
December 08, 1987
Export Citation:
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Assignee:
NIPPON KOKAN KK
International Classes:
G01N21/21; G01N21/55; G02B21/00; (IPC1-7): G01N21/21; G01N21/55; G02B21/00
Attorney, Agent or Firm:
Natsuo Shiotani