MESH FOR TRANSMISSION ELECTRON MICROSCOPE

Title:

MESH FOR TRANSMISSION ELECTRON MICROSCOPE

Document Type and Number:

Japanese Patent JP2007317566

Kind Code:

A

Abstract:

To provide a mesh for a transmission electron microscope having a structure capable of preventing a sample from being lost by protecting the surface on the side holding a sample immediately after the sample is placed on it.

This mesh for the transmission electron microscope has a sample supporting surface, and includes a support having one or a plurality of opening parts, and a protecting member disposed on the sample supporting surface side of the support, and equipped with one or a plurality of opening parts.

Inventors:

GOTO MASAHIDE

Application Number:

JP2006147296A

Publication Date:

December 06, 2007

Filing Date:

May 26, 2006

Export Citation:

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Assignee:

FUJI ELECTRIC HOLDINGS

International Classes:

H01J37/20

Attorney, Agent or Firm:

Yoshikazu Tani
Kazuo Abe

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