Title:
METHOD OF AND APPARATUS FOR DETECTING PERIODICAL DEFECT IN TEST PIECE MOVING IN LONGITUDINAL DIRECTION
Document Type and Number:
Japanese Patent JPH11256441
Kind Code:
A
Abstract:
To provide a method and device for detecting periodical defects in test pieces extending and moving in a longitudinal direction continuously, with a little labor.
This method for detecting periodical defects in test pieces 12 moving in a longitudinal direction, is to perform the measurement of at least 2 continuous parameters in a relatively short interval (W/2) and a time interval, (T1, T2 and T3) so as to detect the periodical defects in the test pieces moving in the longitudinal direction continuously, with a little labor.
Inventors:
FELIX ERNST
Application Number:
JP37780898A
Publication Date:
September 21, 1999
Filing Date:
December 14, 1998
Export Citation:
Assignee:
LUWA AG ZELLWEGER
International Classes:
D01H13/22; G01N21/892; G01N33/36; (IPC1-7): D01H13/22
Attorney, Agent or Firm:
Osamu Nakahira
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