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Patent Searching and Data


Title:
METHOD AND APPARATUS FOR MEASURING VOLTAGE OF ELEMENT TO BE INSPECTED
Document Type and Number:
Japanese Patent JP2013104695
Kind Code:
A
Abstract:

To remove an influence of an offset value of a voltmeter in a measurement of an output voltage of an element to be inspected.

First of all, a relay RLY11 is closed, a relay RLY12 is opened, and a voltage Vt1 between a reference potential terminal T1 and a predetermined voltage terminal T3 is measured by a voltmeter 2. Then, the relay RLY12 is closed, the relay RLY11 is opened, and a voltage Vt2 between the predetermined voltage terminal T3 and a measuring object voltage terminal T2 is measured by the voltmeter 2. An arithmetic processing unit 43 calculates a difference between the measured values of the volts Vt1 and Vt2 to obtain a voltage V between the reference potential terminal T1 and the measuring object volt terminal T2 and also offset an offset voltage contained in the respective measured values.


Inventors:
TACHIBANA KUNIHIKO
Application Number:
JP2011246917A
Publication Date:
May 30, 2013
Filing Date:
November 10, 2011
Export Citation:
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Assignee:
SHARP KK
International Classes:
G01R19/00; G05F1/46
Attorney, Agent or Firm:
Kenzo Hara International Patent Office