METHOD AND DEVICE FOR CHARACTERIZING WAVEFORM

Japanese Patent JP2006258789

A

To provide a method and a device for characterizing a newly captured waveform, to distinguish waveform abnormalities on the basis of variations in the newly captured waveform, from one or more previously captured waveforms.

A history value representing a previously captured waveform relevant to a position is read out, with respect to each of a plurality of positions in a two-dimensional array relevant to the newly captured waveform (220); the count of a counter having a range of history values corresponding to the history value, out of a plurality of counters having individually different ranges of history values, is increased (230); the history value is changed and a new history value is generated (240); the new history value is written as a history value at the position (230); after all positions relevant to the newly captured waveform are processed, the variations in the newly captured waveform are determined with respect to the previously captured waveforms from the counts of the plurality of counters (250).

JP5165355	Measurement data recording device and measurement data recording method
JPS5526972	BODILY SURFACE HEART POTENTIAL DISTRIBUTION FIGURE PREPARING SYSTEM

LETTS PETER J
DOBYNS KENNETH P
GERLACH PAUL M
VEITH KRISTIE

JP2005295628A

September 28, 2006

October 07, 2005

Click for automatic bibliography generation  

TEKTRONIX INC

G01R13/20

JP2004294440A	2004-10-21
JP2000028645A	2000-01-28
JP2000028646A	2000-01-28
JP2000028647A	2000-01-28
JPH07294560A	1995-11-10
JP2010151843A	2010-07-08

US20020180737A1

2002-12-05

Kunio Yamaguchi

Previous Patent: CORE STOPPER FOR ELECTRONIC CLINICAL THERMOMETER

Next Patent: PACIFIER CLINICAL THERMOMETER