Title:
METHOD AND DEVICE FOR MEASURING IMPEDANCE
Document Type and Number:
Japanese Patent JP2001349912
Kind Code:
A
Abstract:
To provide an impedance measuring method for measuring the impedance of a large number of circuit boards in a short time with excellent accuracy.
The end face 61 of a circuit board 3 is set at a predetermined position. After a probe A is moved so as to face the end face 61 of the circuit board 3, the probe A is brought into contact with a test pattern 62 exposed to the end face 61 of the circuit board 3. The impedance of the test pattern 62 is measured by a measuring instrument connected to the probe A. The probe A can be easily brought into contact with the very small test pattern 62 exposed to the end face 61 of the circuit board 3, and the impedance can be easily measured.
Inventors:
NAKASHIBA TORU
MATSUSHITA YUKIO
IWAISHI TATSUMI
TAKETOMI MASANOBU
NAGASO MITSUHIDE
AKAMATSU TOSHIYUKI
MATSUSHITA YUKIO
IWAISHI TATSUMI
TAKETOMI MASANOBU
NAGASO MITSUHIDE
AKAMATSU TOSHIYUKI
Application Number:
JP2000169570A
Publication Date:
December 21, 2001
Filing Date:
June 06, 2000
Export Citation:
Assignee:
MATSUSHITA ELECTRIC WORKS LTD
International Classes:
G01R27/02; G01R31/02; G01R31/28; H05K3/46; G01R1/06; (IPC1-7): G01R27/02; G01R1/06; G01R31/02; G01R31/28; H05K3/46
Attorney, Agent or Firm:
Keisei Nishikawa (1 person outside)
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