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Title:
METHOD AND DEVICE FOR MULTIPLYING MASK PATTERN PARTIALLY AND MASK STRUCTURE
Document Type and Number:
Japanese Patent JP2003007597
Kind Code:
A
Abstract:

To realize highly accurate superposition by performing desired correction of magnification differently in the direction of X axis and in the direction of Y axis.

A force is applied to a mask structure comprising a mask substrate on which a mask pattern is formed and a ring-like supporting frame 1 having a square window 2 with four points on the outer circumference of the supporting frame substantially located on the extension of both diagonals of the square window 2 as pressure applying points 4-7. The force is applied while adjusting the angle of a vector of force with respect to the center of each pressure applying point 4-7. A part of the pressure applying points is divided to apply a force in two orthogonal directions and a part of the vector of force is divided in the direction of X axis and Y axis parallel with the sides of the square window 2 so that the force can be applied to the supporting frame 1.


Inventors:
MORIYA AKIRA
MIYAJI GOJI
HARA SHINICHI
TOKITA TOSHINOBU
Application Number:
JP2001190809A
Publication Date:
January 10, 2003
Filing Date:
June 25, 2001
Export Citation:
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Assignee:
CANON KK
International Classes:
G03F7/20; H01L21/027; (IPC1-7): H01L21/027; G03F7/20
Attorney, Agent or Firm:
Tetsuya Ito