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Title:
METHOD OF LOCATING EMBEDDED IC TAGS
Document Type and Number:
Japanese Patent JP2013044653
Kind Code:
A
Abstract:

To facilitate identifying a two-dimensional location of an IC tag embedded in a structure.

A location identification method is for identifying a two-dimensional surface location of an IC tag embedded in a structure. The method includes: a first reception step where a receiver having a directivity capable of receiving a signal from the IC tag is linearly or rotationally moved as a first move along a first direction other than the direction normal to the surface of the structure to receive the signal; a second reception step where the receiver is linearly moved as a second move along a second direction other than the direction normal to the surface and the first direction, or rotationally moved around an axis other than the rotational axis in the previous step to receive the signal; and a location identification step for identifying the location of the IC tag on the basis of the signal received in the first reception step and the signal received in the second reception step.


Inventors:
SUZUKI SATOSHI
HAMADA YASUSHI
Application Number:
JP2011182837A
Publication Date:
March 04, 2013
Filing Date:
August 24, 2011
Export Citation:
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Assignee:
OHBAYASHI CORP
International Classes:
G01S13/74; G01S13/88; G01V3/00; G01V15/00
Domestic Patent References:
JP2010085290A2010-04-15
JPH11352240A1999-12-24
JP2007093533A2007-04-12
JP2007218644A2007-08-30
JP2010089844A2010-04-22
JP2007137637A2007-06-07
JPH11352240A1999-12-24
JP2007093533A2007-04-12
JP2007218644A2007-08-30
JP2010089844A2010-04-22
JP2007137637A2007-06-07
JP2010085290A2010-04-15
Attorney, Agent or Firm:
Isshiki International Patent Service Corporation